In: SPIE Optical Engineering + Applications 2022, Developments in X-Ray Tomography XIV
Location:San Diego (USA)
Date:21.08.2022 - 26.08.2022
Type:conference lecture (invited)
Cite as: Flenner, S.; Hagemann, J.; Storm, M.; Kubec, A.; Qi, P.; David, C.; Longo, E.; Niese, S.; Gawlitza, P.; Zeller-Plumhoff, B.; Reimers, J.; Müller, M.; Greving, I.: Hard X-ray nanotomography at the P05 Imaging beamline at PETRA III. SPIE Optical Engineering + Applications 2022, Developments in X-Ray Tomography XIV. San Diego (USA), 2022. DOI: 10.1117/12.2632706