Sub 50nm Transmission Kikuchi Diffraction (TKD) of a TiAlNb TEM lamella using a commercial FE-SEM and EBSD system
No abstract available.
URL: https://publications.hereon.de/id/40118/
Authors:Zimmer, D., Gabrisch, H.
Year:2021
In: 109th meeting of the ASMET committee of experts for metallography and microstructure analysis
Location:Leoben (AUT)
Date:28.05.2021
Cite as: Zimmer, D.; Gabrisch, H.: Sub 50nm Transmission Kikuchi Diffraction (TKD) of a TiAlNb TEM lamella using a commercial FE-SEM and EBSD system. In: 109th meeting of the ASMET committee of experts for metallography and microstructure analysis. Leoben (AUT), 28.05.2021, 2021.
