Sub 50nm Transmission Kikuchi Diffraction (TDK) of a TiAlNb TEM lamella using modern FE-SEM and EBSD system
No abstract available.
URL: https://publications.hereon.de/id/40117/
Authors:Schmidt, R., Zimmer, D., Gabrisch, H.
Year:2021
In: MC 2021- Joint Meeting of Dreiländertagung & Multinational Congress on Microscopy
Location:Virtual
Date:22.08.2021 - 26.08.2021
Cite as: Schmidt, R.; Zimmer, D.; Gabrisch, H.: Sub 50nm Transmission Kikuchi Diffraction (TDK) of a TiAlNb TEM lamella using modern FE-SEM and EBSD system. In: MC 2021- Joint Meeting of Dreiländertagung & Multinational Congress on Microscopy. Virtual, 22.08.2021 - 26.08.2021, 2021.
