Electron and atomic force microscopy as tools to characterize polymer membranes
No abstract available.
URL: https://publications.hereon.de/id/37240/
Authors:Abetz, C., Hoehme, A.-L., Sperling, E., Zhang, Z., Rahman, M., dreyer, O., Abetz, V.
Year:2019
In: Microscopy Conference MC 2019
Location:Berlin (D)
Date:01.-05.09.2019
Cite as: Abetz, C.; Hoehme, A.-L.; Sperling, E.; Zhang, Z.; Rahman, M.; dreyer, O.; Abetz, V.: Electron and atomic force microscopy as tools to characterize polymer membranes. In: Microscopy Conference MC 2019 . Berlin (D), 01.-05.09.2019, 2019.
