Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

Hipp, A.C.; Herzen, J.; Hammel, J.U.; Lytaev, P.; Schreyer, A.; Beckmann, F.

Publication

Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

Abstract

Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase- contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

DOI Link to Publication

URL: https://publications.hereon.de/id/34337/
Authors:Hipp, A.C., Herzen, J., Hammel, J.U., Lytaev, P., Schreyer, A., Beckmann, F.
Year:2016
In: Proceedings of SPIE, Optics and Photonics - Developments in X-Ray Tomography X
Volume:9967
Location:San Diego, CA (USA)
Date:28.08.-01.09.2016
Pages:996718
ISBN: 978-1-510-60325-7
Cite as: Hipp, A.C.; Herzen, J.; Hammel, J.U.; Lytaev, P.; Schreyer, A.; Beckmann, F.: Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources. In: Stock, S.R.; Mueller, B.; Wang, G. (Eds.): Proceedings of SPIE, Optics and Photonics - Developments in X-Ray Tomography X. Vol. 9967 San Diego, CA (USA), 28.08.-01.09.2016, 2016. 996718. (DOI: 10.1117/12.2237582) (ISBN: 978-1-510-60325-7)