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Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell

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  • URL: https://publications.hereon.de/id/32972/
  • Authors:Staron, P., Fischer, T., Keckes, J., Schratter, S., Hatzenbichler, T., Schell, N., Mueller, M., Schreyer, A.
  • Year:2012
  • In: International Conference on Residual Stress, ICRS-9
  • Location:Garmisch-Partenkirchen (D)
  • Date:07.-12.10.2012
  • Cite as: Staron, P.; Fischer, T.; Keckes, J.; Schratter, S.; Hatzenbichler, T.; Schell, N.; Mueller, M.; Schreyer, A.: Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell. In: International Conference on Residual Stress, ICRS-9. Garmisch-Partenkirchen (D), 07.-12.10.2012, 2012.
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