Authors:Marschall, F.,Last, A.,Simon, M.,Kluge, M.,Nazmov, V.,Vogt, H.,Ogurreck, M.,Greving, I.,Mohr, J.
Year:2013
In: 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013
Location:Hamburg (D)
Date:02.-06.09.2013
Type:conference lecture
Cite as: Marschall, F.; Last, A.; Simon, M.; Kluge, M.; Nazmov, V.; Vogt, H.; Ogurreck, M.; Greving, I.; Mohr, J.: X-ray Full Field Microscopy at 30 keV. 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013. Hamburg (D), 2013.
