Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
No abstract available.
URL: https://publications.hereon.de/id/30959/
Authors:Gabrisch, H.,Mayer, S.,Pyczak, F.,Rackel, M.,Lorenz, U.,Schell, N.,Schreyer, A.,Stark, A.
Year:2013
In: Microscopy Conference, MC 2013
Location:Regensburg (D)
Date:25.-30.08.2013
Type:conference lecture
Cite as: Gabrisch, H.; Mayer, S.; Pyczak, F.; Rackel, M.; Lorenz, U.; Schell, N.; Schreyer, A.; Stark, A.: Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging. Microscopy Conference, MC 2013. Regensburg (D), 2013.
