Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

Publication

No abstract available.

URL: https://publications.hereon.de/id/30959/
Authors:Gabrisch, H., Mayer, S., Pyczak, F., Rackel, M., Lorenz, U., Schell, N., Schreyer, A., Stark, A.
Year:2013
In: Microscopy Conference, MC 2013
Location:Regensburg (D)
Date:25.-30.08.2013
Cite as: Gabrisch, H.; Mayer, S.; Pyczak, F.; Rackel, M.; Lorenz, U.; Schell, N.; Schreyer, A.; Stark, A.: Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging. In: Microscopy Conference, MC 2013. Regensburg (D), 25.-30.08.2013, 2013.