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In-situ x-ray diffraction studies during co-sputtering deposition of Ni-Ti shape memory alloy films

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  • URL: https://publications.hereon.de/id/27851/
  • Authors:Martins, R.M.S.,Schell, N.,Mahesh, K.K.,Silva, R.J.C.,Braz Fernandes, F.M.
  • Year:2009
  • In: Bi-Annual Report 2007/2008 - Wissenschaftlich-Technische Berichte – Forschungszentrum Dresden-Rossendorf
  • Pages:21-24
  • Publisher:FZD
  • Type:report part
  • Cite as: Martins, R.; Schell, N.; Mahesh, K.; Silva, R.; Braz Fernandes, F.: In-situ x-ray diffraction studies during co-sputtering deposition of Ni-Ti shape memory alloy films. In: Scheinost, A.; Baehtz, C. (Ed.): Bi-Annual Report 2007/2008 - Wissenschaftlich-Technische Berichte – Forschungszentrum Dresden-Rossendorf. FZD. 2009. 21-24.
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