In-situ x-ray diffraction studies during co-sputtering deposition of Ni-Ti shape memory alloy films

Report

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URL: https://publications.hereon.de/id/27851/
Authors:Martins, R.M.S., Schell, N., Mahesh, K.K., Silva, R.J.C., Braz Fernandes, F.M.
Year:2009
In: Bi-Annual Report 2007/2008 - Wissenschaftlich-Technische Berichte – Forschungszentrum Dresden-Rossendorf
Pages:21 - 24
Publisher:FZD
Type:Report
Cite as: Martins, R.M.S.; Schell, N.; Mahesh, K.K.; Silva, R.J.C.; Braz Fernandes, F.M.: In-situ x-ray diffraction studies during co-sputtering deposition of Ni-Ti shape memory alloy films. In: Scheinost, A.C.; Baehtz, C. (Eds.): Bi-Annual Report 2007/2008 - Wissenschaftlich-Technische Berichte – Forschungszentrum Dresden-Rossendorf. 2009. 21 - 24.