In-situ study of the preferential orientation of magnetron sputtered Ni-Ti thin films as a function of bias and substrate type

conference paper

No abstract available.

URL: https://publications.hereon.de/id/27065/
Authors:Martins, R.M.S.,Schell, N.,Beckers, M.,Muecklich, A.,Reuther, H.,Silva, R.J.C.,Mahesh, K.K.,Braz Fernandes, F.M.
Year:2008
In: SMST-2006, Proceedings of the International Conference on Shape Memory and Superelastic Technologies
Location:Pacific Grove, CA (USA)
Date:07.-11.05.2006
Pages:363-372
Publisher:ASM International, Ohio
Type:conference paper
ISBN: 978-0-87170-862-5
Cite as: Martins, R.; Schell, N.; Beckers, M.; Muecklich, A.; Reuther, H.; Silva, R.; Mahesh, K.; Braz Fernandes, F.: In-situ study of the preferential orientation of magnetron sputtered Ni-Ti thin films as a function of bias and substrate type. In: Berg, B.; Mitchell, M.; Proft, J. (Ed.): SMST-2006, Proceedings of the International Conference on Shape Memory and Superelastic Technologies. Pacific Grove, CA (USA). Ohio: ASM International. 2008. 363-372.