In-situ study of the preferential orientation of magnetron sputtered Ni-Ti thin films as a function of bias and substrate type

conference lecture

No abstract available.

URL: https://publications.hereon.de/id/27064/
Authors:Martins, R.M.S.,Schell, N.,Beckers, M.,Muecklich, A.,Reuther, H.,Silva, R.J.C.,Mahesh, K.K.,Braz Fernandes, F.M.
Year:2006
In: International Conference on Shape Memory and Superelastic Technologies, SMST-2006
Location:Pacific Grove, CA (USA)
Date:07.-11.05.2006
Type:conference lecture
Cite as: Martins, R.; Schell, N.; Beckers, M.; Muecklich, A.; Reuther, H.; Silva, R.; Mahesh, K.; Braz Fernandes, F.: In-situ study of the preferential orientation of magnetron sputtered Ni-Ti thin films as a function of bias and substrate type. International Conference on Shape Memory and Superelastic Technologies, SMST-2006. Pacific Grove, CA (USA), 2006.