Estimation of Creep Rate in TiAl from Short-term Stress Relaxation Tests

Publication

No abstract available.

URL: https://publications.hereon.de/id/26177/
Authors:Paul, J., Hoppe, R., Lorenz, U., Oehring, M., Appel, F.
Year:2008
In: Materials Science and Engineering, MSE 2008
Location:Nuernberg (D)
Date:01.-04.09.2008
Cite as: Paul, J.; Hoppe, R.; Lorenz, U.; Oehring, M.; Appel, F.: Estimation of Creep Rate in TiAl from Short-term Stress Relaxation Tests. In: Materials Science and Engineering, MSE 2008. Nuernberg (D), 01.-04.09.2008, 2008.