Authors:Hertlein, F.,Wiesmann, J.,Michaelsen, C.,Stoermer, M.,Seifert, A.
Year:2007
In: Proceeding SPIE, International Congress on Optics and Optoelectronics 2007, Damage to VUV, EUV, and X-ray Optics
Volume:6586
Location:Prag (CZ)
Date:16.-20.04.2007
Pages:658608
Type:conference paper
ISBN: 9780819467140
Cite as: Hertlein, F.; Wiesmann, J.; Michaelsen, C.; Stoermer, M.; Seifert, A.: State-of-the-art thin film X-ray optics for synchrotrons and FEL sources. In: Juha, L.; Sobierajski, R.; Wabnitz, H. (Ed.): Proceeding SPIE, International Congress on Optics and Optoelectronics 2007, Damage to VUV, EUV, and X-ray Optics. Prag (CZ). 2007. 658608. DOI: 10.1117/12.722452