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Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold
No abstract available.
URL:
https://publications.hereon.de/id/25779/
Authors:
Juha, L., Hajkova, V., Chalupsky, J., Vorlicek, V., Ritucci, A., Reale, A., Zuppella, P., Stoermer, M.
Year:
2007
In:
Proceeding SPIE, International Congress on Optics and Optoelectronics 2007, Damage to VUV, EUV, and X-ray Optics
Volume:
6586
Location:
Prag (CZ)
Date:
16.-20.04.2007
Pages:
65860D
Type:
Confpaper
ISBN:
9780819467140
Cite as:
Juha, L.; Hajkova, V.; Chalupsky, J.; Vorlicek, V.; Ritucci, A.; Reale, A.; Zuppella, P.; Stoermer, M.: Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold. In: Juha, L.; Sobierajski, R.H.; Wabnitz, H. (Eds.): Proceeding SPIE, International Congress on Optics and Optoelectronics 2007, Damage to VUV, EUV, and X-ray Optics. Vol. 6586 Prag (CZ), 16.-20.04.2007, 2007. 65860D. (ISBN: 9780819467140)
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