Tomographic Analysis and FE-Simulations of MMC-Microstructures under Load

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/24896/
Authors:Crostack, H.-A., Nellesen, J., Fischer, G., Schmauder, S., Weber, U., Beckmann, F.
Year:2006
In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006
Location:San Diego, CA (USA)
Date:15.-17.08.2006
Pages:63181A
Type:Confpaper
ISBN: 0-8194-6439-2
Cite as: Crostack, H.-A.; Nellesen, J.; Fischer, G.; Schmauder, S.; Weber, U.; Beckmann, F.: Tomographic Analysis and FE-Simulations of MMC-Microstructures under Load. In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006. San Diego, CA (USA), 15.-17.08.2006, 2006. 63181A. (ISBN: 0-8194-6439-2)