Image metrics for the automated alignment of microtomography data
No abstract available.
URL: https://publications.hereon.de/id/24882/
Authors:Donath, T.,Beckmann, F.,Schreyer, A.
Year:2006
In: Optics and Photonics, SPIE 2006
Location:San Diego, CA (USA)
Date:15.-17.08.2006
Type:conference lecture (invited)
Cite as: Donath, T.; Beckmann, F.; Schreyer, A.: Image metrics for the automated alignment of microtomography data. Optics and Photonics, SPIE 2006. San Diego, CA (USA), 2006.
