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conference paper

Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses

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  • URL: https://publications.hereon.de/id/24879/
  • Authors:Schroer, C.G.,Kuhlmann, M.,Guenzler, T.F.,Benner, B.,Kurapova, C.,Patommel, J.,Lengeler, B.,Roth, S.V.,Gehrke, R.,Snigirev, A.,Snigireva, I.,Almendarez-Camarillo, A.,Beckmann, F.
  • Year:2006
  • In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006
  • Volume:6318
  • Location:San Diego, CA (USA)
  • Date:15.-17.08.2006
  • Pages:63181H
  • Type:conference paper
  • ISBN: 0-8194-6439-2
  • Cite as: Schroer, C.; Kuhlmann, M.; Guenzler, T.; Benner, B.; Kurapova, C.; Patommel, J.; Lengeler, B.; Roth, S.; Gehrke, R.; Snigirev, A.; Snigireva, I.; Almendarez-Camarillo, A.; Beckmann, F.: Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses. In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006. San Diego, CA (USA). 2006. 63181H.
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