An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl
No abstract available.
URL: https://publications.hereon.de/id/24157/
Authors:Appel, F., Lorenz, U., Oehring, M.
Year:1999
In: Advances in Materials, Problem Solving with the Electron Microscope, Materials Research Society, Symposium
Location:Boston, MA (USA)
Date:30.11.-03.12.1999
Cite as: Appel, F.; Lorenz, U.; Oehring, M.: An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl. In: Advances in Materials, Problem Solving with the Electron Microscope, Materials Research Society, Symposium. Boston, MA (USA), 30.11.-03.12.1999, 1999.
