An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl
No abstract available.
URL: https://publications.hereon.de/id/24156/
Authors:Appel, F., Lorenz, U., Oehring, M.
Year:2001
In: Advances in Materials, Problem Solving with the Electron Microscope, Materials Research Society, Symposium
Volume:589
Location:Boston, MA (USA)
Date:30.11.-03.12.1999
Pages:105 - 110
Type:Confpaper
ISBN: 1-55899-497-1
Cite as: Appel, F.; Lorenz, U.; Oehring, M.: An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl. In: Bentley, J.; Allen, C.; Dahmen, U.; Petrov, I. (Eds.): Advances in Materials, Problem Solving with the Electron Microscope, Materials Research Society, Symposium. Vol. 589 Boston, MA (USA), 30.11.-03.12.1999, 2001. 105 - 110. (ISBN: 1-55899-497-1)
