Development of thin-film total-reflection mirrors for the XUV-FEL
No abstract available.
URL: https://publications.hereon.de/id/24024/
Authors:Jacobi, S.,Wiesmann, J.,Steeg, B.,Feldhaus, J.,Michaelsen, C.
Year:2001
In: Optics for Forth-Generation X-ray Sources, SPIE´S - 46th Annual Meeting, International Symposium on Optical Science and Technology
Location:San Diego, CA (USA)
Date:29.07.-03.08.2001
Type:conference poster
Cite as: Jacobi, S.; Wiesmann, J.; Steeg, B.; Feldhaus, J.; Michaelsen, C.: Development of thin-film total-reflection mirrors for the XUV-FEL. In: Optics for Forth-Generation X-ray Sources, SPIE´S - 46th Annual Meeting, International Symposium on Optical Science and Technology. San Diego, CA (USA). 2001.
