Comparison of conventional and synchrotron radiation based microtomography of bone around dental implants
No abstract available.
URL: https://publications.hereon.de/id/23368/
Authors:Cattaneo, P.M.,Dalstra, M.,Beckmann, F.,Donath, T.,Melsen, B.
Year:2004
In: SPIE Annual Meeting 2004, Developments in X-Ray Tomography IV
Volume:5535
Location:Denver, CO (USA)
Date:04.-06.08.2004
Pages:757-764
Type:conference paper
ISBN: 0-8194-5473-7
Cite as: Cattaneo, P.; Dalstra, M.; Beckmann, F.; Donath, T.; Melsen, B.: Comparison of conventional and synchrotron radiation based microtomography of bone around dental implants. In: SPIE Annual Meeting 2004, Developments in X-Ray Tomography IV. Denver, CO (USA). 2004. 757-764.
