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Confpaper
Characterization of polyurethane scaffolds using synchrotron radiation computed microtomography
No abstract available.
URL:
https://publications.hereon.de/id/22750/
Authors:
Donath, T., Beckmann, F., Heijkants, R.G.J.C., Brunke, O., Schreyer, A.
Year:
2004
In:
SPIE 49th Annual Meeting, Optical Scienece and Technology, Developments in X-Ray Tomography IV
Volume:
5535
Location:
Denver, CO (USA)
Date:
02.-06.08.2004
Pages:
91
Type:
Confpaper
Cite as:
Donath, T.; Beckmann, F.; Heijkants, R.G.J.C.; Brunke, O.; Schreyer, A.: Characterization of polyurethane scaffolds using synchrotron radiation computed microtomography. In: SPIE 49th Annual Meeting, Optical Scienece and Technology, Developments in X-Ray Tomography IV. Vol. 5535 Denver, CO (USA), 02.-06.08.2004, 2004. 91.
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