Creep of Gamma-TiAl Sheet Material with a High Niobium Content

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/22712/
Authors:Bystrzanowski, S., Bartels, A., Clemens, H., Gerling, H., Schimansky, F.P., Kestler, H., Dehm, G., Haneczok, G., Weller, M.
Year:2003
In: Gamma Titanium Aluminides, TMS Annual Meeting 2003
Location:San Diego, CA (USA)
Date:02.-06.03.2003
Pages:431 - 436
Type:Confpaper
ISBN: 0-87339-543-3
Cite as: Bystrzanowski, S.; Bartels, A.; Clemens, H.; Gerling, H.; Schimansky, F.P.; Kestler, H.; Dehm, G.; Haneczok, G.; Weller, M.: Creep of Gamma-TiAl Sheet Material with a High Niobium Content. In: Kim, Y.-W.; Clemens, H.; Rosenberger, A.H. (Eds.): Gamma Titanium Aluminides, TMS Annual Meeting 2003. San Diego, CA (USA), 02.-06.03.2003, 2003. 431 - 436. (ISBN: 0-87339-543-3)