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conference paper
Creep of Gamma-TiAl Sheet Material with a High Niobium Content
No abstract available.
URL:
https://publications.hereon.de/id/22712/
Authors:
Bystrzanowski, S.,Bartels, A.,Clemens, H.,Gerling, H.,Schimansky, F.P.,Kestler, H.,Dehm, G.,Haneczok, G.,Weller, M.
Year:
2003
In:
Gamma Titanium Aluminides, TMS Annual Meeting 2003
Location:
San Diego, CA (USA)
Date:
02.-06.03.2003
Pages:
431-436
Type:
conference paper
ISBN:
0-87339-543-3
Cite as:
Bystrzanowski, S.; Bartels, A.; Clemens, H.; Gerling, H.; Schimansky, F.; Kestler, H.; Dehm, G.; Haneczok, G.; Weller, M.: Creep of Gamma-TiAl Sheet Material with a High Niobium Content. In: Kim, Y.; Clemens, H.; Rosenberger, A. (Ed.): Gamma Titanium Aluminides, TMS Annual Meeting 2003. San Diego, CA (USA). 2003. 431-436.
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