Creep Behavior and Microstructural Changes During Short-Term Creep in a y-TiAl Based Alloy with Fully Lamellar Microstructure

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/22693/
Authors:Chatterjee, A., Clemens, H., Dehm, G., Mecking, H., Kestler, H., Arzt, E.
Year:2003
In: Gamma Titanium Aluminides, TMS Annual Meeting 2003
Location:San Diego, CA (USA)
Date:02.-06.03.2003
Pages:425 - 430
Type:Confpaper
ISBN: 0-87339-543-3
Cite as: Chatterjee, A.; Clemens, H.; Dehm, G.; Mecking, H.; Kestler, H.; Arzt, E.: Creep Behavior and Microstructural Changes During Short-Term Creep in a y-TiAl Based Alloy with Fully Lamellar Microstructure. In: Kim, Y.-W.; Clemens, H.; Rosenberger, A.H. (Eds.): Gamma Titanium Aluminides, TMS Annual Meeting 2003. San Diego, CA (USA), 02.-06.03.2003, 2003. 425 - 430. (ISBN: 0-87339-543-3)