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Creep Behavior and Microstructural Changes During Short-Term Creep in a y-TiAl Based Alloy with Fully Lamellar Microstructure

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  • URL: https://publications.hereon.de/id/22692/
  • Authors:Chatterjee, A., Clemens, H., Dehm, G., Mecking, H., Kestler, H., Arzt, E.
  • Year:2003
  • In: TMS 2003 Annual Meeting
  • Location:San Diego, CA (USA)
  • Date:02.-06.03.2003
  • Cite as: Chatterjee, A.; Clemens, H.; Dehm, G.; Mecking, H.; Kestler, H.; Arzt, E.: Creep Behavior and Microstructural Changes During Short-Term Creep in a y-TiAl Based Alloy with Fully Lamellar Microstructure. In: TMS 2003 Annual Meeting. San Diego, CA (USA), 02.-06.03.2003, 2003.
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