Characterization of La/B4C multilayer systems by geometric phase method

conference poster

No abstract available.

URL: https://publications.hereon.de/id/22678/
Authors:Haeussler, D.,Yang, S.,Spiecker, E.,Jaeger, W.,Stoermer, M.,Zwicker, G.
Year:2004
In: European Microscopy Congress, EMC 2004
Location:Antwerpen (B)
Date:22.-27.08.2004
Type:conference poster
Cite as: Haeussler, D.; Yang, S.; Spiecker, E.; Jaeger, W.; Stoermer, M.; Zwicker, G.: Characterization of La/B4C multilayer systems by geometric phase method. In: European Microscopy Congress, EMC 2004. Antwerpen (B). 2004.