Characterization of La/B4C multilayer systems by geometric phase method

Publication

No abstract available.

URL: https://publications.hereon.de/id/22678/
Authors:Haeussler, D., Yang, S., Spiecker, E., Jaeger, W., Stoermer, M., Zwicker, G.
Year:2004
In: European Microscopy Congress, EMC 2004
Location:Antwerpen (B)
Date:22.-27.08.2004
Cite as: Haeussler, D.; Yang, S.; Spiecker, E.; Jaeger, W.; Stoermer, M.; Zwicker, G.: Characterization of La/B4C multilayer systems by geometric phase method. In: European Microscopy Congress, EMC 2004. Antwerpen (B), 22.-27.08.2004, 2004.