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Creep of Gamma-TiAl Sheet Material with a High Niobium Content

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  • URL: https://publications.hereon.de/id/21523/
  • Authors:Bystrzanowski, S., Bartels, A., Clemens, H., Gerling, H., Schimansky, F.P., Kestler, H., Dehm, G., Haneczok, G., Weller, M.
  • Year:2003
  • In: TMS Annual Meeting 2003
  • Location:San Diego, CA (USA)
  • Date:02.-06.03.2003
  • Cite as: Bystrzanowski, S.; Bartels, A.; Clemens, H.; Gerling, H.; Schimansky, F.P.; Kestler, H.; Dehm, G.; Haneczok, G.; Weller, M.: Creep of Gamma-TiAl Sheet Material with a High Niobium Content. In: TMS Annual Meeting 2003. San Diego, CA (USA), 02.-06.03.2003, 2003.
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