Weak-beam TEM study on planar fault energies of Al-lean TiAl-base alloys
No abstract available.
URL: https://publications.hereon.de/id/21346/
Authors:Zhang, W.-J., Appel, F.
Year:2002
In: Materials Science and Engineering A
Volume:334
Pages:59 - 64
Type:Journalpaper
ISSN: 0921-5093
Cite as: Zhang, W.-J.; Appel, F.: Weak-beam TEM study on planar fault energies of Al-lean TiAl-base alloys. In: Materials Science and Engineering A. Vol. 334 (2002) 59 - 64.