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Journalpaper

Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance

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  • URL: https://publications.hereon.de/id/21048/
  • Authors:Boehm, J., Wanner, A., Kampmann, R., Franz, H., Liss, K.-D., Schreyer, A., Clemens, H.
  • Year:2003
  • In: Nuclear Instruments and Methods in Physics Research B
  • Volume:200
  • Pages:315 - 322
  • Type:Journalpaper
  • ISSN: 0168-583X
  • Cite as: Boehm, J.; Wanner, A.; Kampmann, R.; Franz, H.; Liss, K.-D.; Schreyer, A.; Clemens, H.: Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance. In: Nuclear Instruments and Methods in Physics Research B. Vol. 200 (2003) 315 - 322.
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