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journal article

Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance

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  • URL: https://publications.hereon.de/id/21048/
  • Authors:Boehm, J.,Wanner, A.,Kampmann, R.,Franz, H.,Liss, K.-D.,Schreyer, A.,Clemens, H.
  • Year:2003
  • In: Nuclear Instruments and Methods in Physics Research B
  • Volume:200
  • Pages:315-322
  • Type:journal article
  • ISSN: 0168-583X
  • Cite as: Boehm, J.; Wanner, A.; Kampmann, R.; Franz, H.; Liss, K.; Schreyer, A.; Clemens, H.: Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance. Nuclear Instruments and Methods in Physics Research B. 2003. vol. 200, 315-322.
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