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conference poster

Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance

No abstract available.
  • URL: https://publications.hereon.de/id/21047/
  • Authors:Boehm, J.,Wanner, a.,Kampmann, R.,Franz, H.,Liss, K.-D.,Schreyer, A.,Clemens, H.
  • Year:2002
  • In: E-MRS Spring Meeting 2002, Symposium
  • Location:Strasbourg (F)
  • Date:18.-21.06.2002
  • Type:conference poster
  • Cite as: Boehm, J.; Wanner, a.; Kampmann, R.; Franz, H.; Liss, K.; Schreyer, A.; Clemens, H.: Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance. In: E-MRS Spring Meeting 2002, Symposium. Strasbourg (F). 2002.
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