A formula for the background in TXRF as a function of the incidence angle and substrate material
No abstract available.
URL: https://publications.hereon.de/id/20806/
Authors:Knoth, J., Prange, A., Reus, U., Schwenke, H.
Year:1998
In: 7th Conference on Total Reflection X-ray floureescence Analysis and Related Methods
Location:Austin, TX (USA)
Date:27.09.-02.10.1998
Cite as: Knoth, J.; Prange, A.; Reus, U.; Schwenke, H.: A formula for the background in TXRF as a function of the incidence angle and substrate material. In: 7th Conference on Total Reflection X-ray floureescence Analysis and Related Methods. Austin, TX (USA), 27.09.-02.10.1998, 1998.
