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Microscopic characterisation of gamma-TiAl diffusion bonded joint interfaces

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  • URL: https://publications.hereon.de/id/20764/
  • Authors:Buque, C., Eggert, S., Lorenz, U., Appel, F.
  • Year:2002
  • In: TMS Annual Meeting, 'Fundamentals of Structural Intermetallics'
  • Location:Seattle (USA)
  • Date:17.-21.02.2002
  • Cite as: Buque, C.; Eggert, S.; Lorenz, U.; Appel, F.: Microscopic characterisation of gamma-TiAl diffusion bonded joint interfaces. In: TMS Annual Meeting, 'Fundamentals of Structural Intermetallics'. Seattle (USA), 17.-21.02.2002, 2002.
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