Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers
No abstract available.
URL: https://publications.hereon.de/id/20623/
Authors:Jacobi, S.,Wiesmann, J.,Steeg, B.,Stoermer, M.,Feldhaus, J.,Michaelsen, C.
Year:2002
In: Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology
Location:Seattle, WA (USA)
Date:07.-11.07.2002
Type:conference lecture
Cite as: Jacobi, S.; Wiesmann, J.; Steeg, B.; Stoermer, M.; Feldhaus, J.; Michaelsen, C.: Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers. Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology. Seattle, WA (USA), 2002.
