Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers
No abstract available.
URL: https://publications.hereon.de/id/20623/
Authors:Jacobi, S., Wiesmann, J., Steeg, B., Stoermer, M., Feldhaus, J., Michaelsen, C.
Year:2002
In: Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology
Location:Seattle, WA (USA)
Date:07.-11.07.2002
Cite as: Jacobi, S.; Wiesmann, J.; Steeg, B.; Stoermer, M.; Feldhaus, J.; Michaelsen, C.: Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers. In: Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology. Seattle, WA (USA), 07.-11.07.2002, 2002.
