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Confpaper

Creep Behavior and Microstructural Stability of Lamellar Gamma-TiAl (Cr, Mo, SI, B) with Extremely Fine Lamellar Spacing

No abstract available.
  • URL: https://publications.hereon.de/id/20162/
  • Authors:Schillinger, W., Zhang, D., Dehm, G., Bartels, A., Clemens, H.
  • Year:2001
  • In: Materials Research Society Symposium
  • Volume:646
  • Location:Bosten, MA (USA)
  • Date:27.11.-01.12.2000
  • Type:Confpaper
  • Cite as: Schillinger, W.; Zhang, D.; Dehm, G.; Bartels, A.; Clemens, H.: Creep Behavior and Microstructural Stability of Lamellar Gamma-TiAl (Cr, Mo, SI, B) with Extremely Fine Lamellar Spacing. In: Materials Research Society Symposium. Vol. 646 Bosten, MA (USA), 27.11.-01.12.2000, 2001.
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