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Soft X-ray diffraction up to wavelengths of 6.0 A becomes feasable at ID1 of ESFR
No abstract available.
URL:
https://publications.hereon.de/id/20138/
Authors:
Carpentier, P., Boesacke, P., Bois, J.-M., Chesne, M.-L., Fanchon, E., Kahn, R., Stuhrmann, H., Vicat, J.
Year:
2001
In:
International Symposium on Synchrotron Radiation Crystallography
Location:
Krynica (PL)
Date:
31.08.-04.09.2001
Cite as:
Carpentier, P.; Boesacke, P.; Bois, J.-M.; Chesne, M.-L.; Fanchon, E.; Kahn, R.; Stuhrmann, H.; Vicat, J.: Soft X-ray diffraction up to wavelengths of 6.0 A becomes feasable at ID1 of ESFR. In: International Symposium on Synchrotron Radiation Crystallography. Krynica (PL), 31.08.-04.09.2001, 2001.
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