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Confpaper
Development of thin-film total-reflection mirrors for the XUV-FEL
No abstract available.
URL:
https://publications.hereon.de/id/20116/
Authors:
Jacobi, S., Wiesmann, J., Steeg, B., Feldhaus, J., Michaelsen, C.,
Year:
2001
In:
Optics for Forth-Generation X-ray Sources, SPIE´S - 46th Annual Meeting, International Symposium on Optical Science and Technology
Volume:
4500
Location:
San Diego, CA (USA)
Date:
29.07.-03.08.2001
Pages:
187 - 192
Type:
Confpaper
Cite as:
Jacobi, S.; Wiesmann, J.; Steeg, B.; Feldhaus, J.; Michaelsen, C.; : Development of thin-film total-reflection mirrors for the XUV-FEL. In: Tatchyn, R.O.; Freund, A.K.; Matsushita, T. (Eds.): Optics for Forth-Generation X-ray Sources, SPIE´S - 46th Annual Meeting, International Symposium on Optical Science and Technology. Vol. 4500 San Diego, CA (USA), 29.07.-03.08.2001, 2001. 187 - 192.
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