Characterization of structure and interfaces of new multilayer x-ray mirrors

Publication

No abstract available.

URL: https://publications.hereon.de/id/19992/
Authors:Michaelsen, C., Wiesmann, J., Bormann, R., Hollensteiner, S., Dieker, C., Jaeger, W.
Year:2001
In: Dreilaendertagung fuer Elektronenmikroskopie 2001
Location:Innsbruck (A)
Date:09.-14.09.2001
Cite as: Michaelsen, C.; Wiesmann, J.; Bormann, R.; Hollensteiner, S.; Dieker, C.; Jaeger, W.: Characterization of structure and interfaces of new multilayer x-ray mirrors. In: Dreilaendertagung fuer Elektronenmikroskopie 2001. Innsbruck (A), 09.-14.09.2001, 2001.