Characterization of structure and interfaces of new multilayer x-ray mirrors

conference poster

No abstract available.

URL: https://publications.hereon.de/id/19992/
Authors:Michaelsen, C.,Wiesmann, J.,Bormann, R.,Hollensteiner, S.,Dieker, C.,Jaeger, W.
Year:2001
In: Dreilaendertagung fuer Elektronenmikroskopie 2001
Location:Innsbruck (A)
Date:09.-14.09.2001
Type:conference poster
Cite as: Michaelsen, C.; Wiesmann, J.; Bormann, R.; Hollensteiner, S.; Dieker, C.; Jaeger, W.: Characterization of structure and interfaces of new multilayer x-ray mirrors. In: Dreilaendertagung fuer Elektronenmikroskopie 2001. Innsbruck (A). 2001.