MAUD (Naturiel Analysis Using Diffraction): A user friendly JAVA program for Rietveld texture analysis and more
No abstract available.
URL: https://publications.hereon.de/id/18913/
Authors:Lutterotti, L.,Matthies, S.,Wenk, H.R.
Year:1999
In: 12th International Conference on Textures of Materials ICOTOM XII
Location:Montreal (CDN)
Date:09.-13.08.1999
Pages:1599-1604
Type:conference paper,conference lecture
Cite as: Lutterotti, L.; Matthies, S.; Wenk, H.: MAUD (Naturiel Analysis Using Diffraction): A user friendly JAVA program for Rietveld texture analysis and more. In: Szpunar, J. (Ed.): 12th International Conference on Textures of Materials ICOTOM XII. Montreal (CDN). 1999. 1599-1604.
