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Journalpaper
Applications of Total Reflection X-ray Fluorescence Spectrometry in Trace Element and Surface Analysis
No abstract available.
URL:
https://publications.hereon.de/id/18740/
Authors:
Schwenke, H., Beaven, P., Knoth, J.
Year:
1999
In:
Fresenius Journal of Analytical Chemistry
Volume:
365
Pages:
19 - 27
Type:
Journalpaper
ISSN:
0937-0633
Cite as:
Schwenke, H.; Beaven, P.; Knoth, J.: Applications of Total Reflection X-ray Fluorescence Spectrometry in Trace Element and Surface Analysis. In: Fresenius Journal of Analytical Chemistry. Vol. 365 (1999) 19 - 27.
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