Applications of Total Reflection X-ray Fluorescence Spectrometry in Trace Element and Surface Analysis
No abstract available.
URL: https://publications.hereon.de/id/18740/
Authors:Schwenke, H.,Beaven, P.,Knoth, J.
Year:1999
In: Fresenius Journal of Analytical Chemistry
Volume:365
Pages:19-27
Type:journal article
ISSN: 0937-0633
Cite as: Schwenke, H.; Beaven, P.; Knoth, J.: Applications of Total Reflection X-ray Fluorescence Spectrometry in Trace Element and Surface Analysis. Fresenius Journal of Analytical Chemistry. 1999. vol. 365, 19-27.
