Burger
Journalpaper

High-resolution quantitative X-ray microanalysis of Nb/Al multilayer thin films using the Zeta-factor approach

No abstract available.
  • URL: https://publications.hereon.de/id/18696/
  • Authors:Lucadamo, G., Watanabe, M., Barmak, K., Williams, D.B., Michaelsen, C., Alani, R.
  • Year:1999
  • In: Philosophical Magazine A
  • Volume:79
  • Issue:6
  • Pages:1423 - 1442
  • Type:Journalpaper
  • ISSN: 0141-8610
  • Cite as: Lucadamo, G.; Watanabe, M.; Barmak, K.; Williams, D.B.; Michaelsen, C.; Alani, R.: High-resolution quantitative X-ray microanalysis of Nb/Al multilayer thin films using the Zeta-factor approach. In: Philosophical Magazine A. Vol. 79 (1999) 6, 1423 - 1442.
QR Code: Link to publication