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journal article

High-resolution quantitative X-ray microanalysis of Nb/Al multilayer thin films using the Zeta-factor approach

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  • URL: https://publications.hereon.de/id/18696/
  • Authors:Lucadamo, G.,Watanabe, M.,Barmak, K.,Williams, D.B.,Michaelsen, C.,Alani, R.
  • Year:1999
  • In: Philosophical Magazine A
  • Volume:79
  • Issue:6
  • Pages:1423-1442
  • Type:journal article
  • ISSN: 0141-8610
  • Cite as: Lucadamo, G.; Watanabe, M.; Barmak, K.; Williams, D.; Michaelsen, C.; Alani, R.: High-resolution quantitative X-ray microanalysis of Nb/Al multilayer thin films using the Zeta-factor approach. Philosophical Magazine A. 1999. vol. 79, no. 6, 1423-1442.
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