Laterally graded multilayer optics for x-ray analysis

conference paper

No abstract available.

URL: https://publications.hereon.de/id/18485/
Authors:Schuster, M.,Goebel, H.,Bruegemann, L.,Bahr, D.,Burgaezy, F.,Michaelsen, C.,Stoermer, M.,Ricardo, P.,Dietsch, R.,Holz, T.,Mai, H.
Year:1999
In: SPIE, EUV, X-Ray, and Neutron Optics and Sources
Volume:3767
Location:Denver, CO (USA)
Date:18.-23.07.1999
Pages:183-198
Type:conference paper
Cite as: Schuster, M.; Goebel, H.; Bruegemann, L.; Bahr, D.; Burgaezy, F.; Michaelsen, C.; Stoermer, M.; Ricardo, P.; Dietsch, R.; Holz, T.; Mai, H.: Laterally graded multilayer optics for x-ray analysis. In: SPIE, EUV, X-Ray, and Neutron Optics and Sources. Denver, CO (USA). 1999. 183-198.