Measurement of the absorption cross section of sulfur dioxide between 265 and 298 nanometers
No abstract available.
URL: https://publications.hereon.de/id/17151/
Authors:Thomsen, O.,Bisling, P.,Weitkamp, C.,Michaelis, W.
Year:1990
In: Fifteenth International Laser Radar Conference, part II
Location:Tomsk (RUS)
Date:July 23-27, 1990
Pages:180-183
Type:conference paper,conference lecture
Cite as: Thomsen, O.; Bisling, P.; Weitkamp, C.; Michaelis, W.: Measurement of the absorption cross section of sulfur dioxide between 265 and 298 nanometers. In: Gordov, E.; Samokhvalov, I. (Ed.): Fifteenth International Laser Radar Conference, part II. Tomsk (RUS). 1990. 180-183.
