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Confpaper

Measurement of the absorption cross section of sulfur dioxide between 265 and 298 nanometers

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  • URL: https://publications.hereon.de/id/17151/
  • Authors:Thomsen, O., Bisling, P., Weitkamp, C., Michaelis, W.
  • Year:1990
  • In: Fifteenth International Laser Radar Conference, part II
  • Location:Tomsk (RUS)
  • Date:July 23-27, 1990
  • Pages: 180 - 183
  • Type:Confpaper
  • Cite as: Thomsen, O.; Bisling, P.; Weitkamp, C.; Michaelis, W.: Measurement of the absorption cross section of sulfur dioxide between 265 and 298 nanometers. In: Gordov, E.P.; Samokhvalov, I.V. (Eds.): Fifteenth International Laser Radar Conference, part II. Tomsk (RUS), July 23-27, 1990, 1990. 180 - 183.
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