Characterization of near surface layers by means of total reflection X-ray fluorescence spectrometry
No abstract available.
URL: https://publications.hereon.de/id/17052/
Authors:Schwenke, H.,Gutschke, R.,Knoth, J.
Year:1992
In: Advances in X-Ray Analysis: Proceedings of combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis
Cite as: Schwenke, H.; Gutschke, R.; Knoth, J.: Characterization of near surface layers by means of total reflection X-ray fluorescence spectrometry. In: Barrett, C.; Gilfrich, J.; Huang, T.; Jenkins, R.; McCarthy, G.; Predecki, P.; Ryon, R.; Smith, D. (Ed.): Advances in X-Ray Analysis: Proceedings of combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis. Hilo and Honolulu, HI (USA). 1992. 941-946.
