How to use the features of total-reflection of X-rays for energy dispersive XRF
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URL: https://publications.hereon.de/id/17051/
Authors:Schwenke, H., Berneike, W., Knoth, J., Weisbrod, U.
Year:1989
In: Advances in X-Ray Analysis: Proceedings of the Thirty-seventh Annual Conference on Applications of X-Ray Analysis
Location:Steamboat Springs, CO (USA)
Date:August 1-5, 1988
Issue:32
Pages: 105 - 114
Type:Confpaper
ISBN: 0306432366
Cite as: Schwenke, H.; Berneike, W.; Knoth, J.; Weisbrod, U.: How to use the features of total-reflection of X-rays for energy dispersive XRF. In: Barrett, C.S.; Gilfrich, J.V.; Jenkins, R.; Huang, T.C.; Predecki, P.K. (Eds.): Advances in X-Ray Analysis: Proceedings of the Thirty-seventh Annual Conference on Applications of X-Ray Analysis. Steamboat Springs, CO (USA), August 1-5, 1988, 1989. 32, 105 - 114. (ISBN: 0306432366)
