Cite as: Schwenke, H.; Berneike, W.; Knoth, J.; Weisbrod, U.: How to use the features of total-reflection of X-rays for energy dispersive XRF. In: Barrett, C.; Gilfrich, J.; Jenkins, R.; Huang, T.; Predecki, P. (Ed.): Advances in X-Ray Analysis: Proceedings of the Thirty-seventh Annual Conference on Applications of X-Ray Analysis. Steamboat Springs, CO (USA). 1989. 105-114.
