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Confpaper
Compact High-Resolution Michelson Interferometer for Mie-to-Rayleigh Scattering Ratio Measurements
No abstract available.
URL:
https://publications.hereon.de/id/16995/
Authors:
Schmidt, W., Weitkamp, C., Michaelis, W.
Year:
1990
In:
Fifteenth International Laser Radar Conference: Part I
Location:
Tomsk (RUS)
Date:
July 23-27, 1990
Pages:
362 - 365
Type:
Confpaper
Cite as:
Schmidt, W.; Weitkamp, C.; Michaelis, W.: Compact High-Resolution Michelson Interferometer for Mie-to-Rayleigh Scattering Ratio Measurements. In: Gordov, E.P.; Samokhvalov, I.V. (Eds.): Fifteenth International Laser Radar Conference: Part I. Tomsk (RUS), July 23-27, 1990, 1990. 362 - 365.
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