Trace element analysis using Total Reflection X-ray Flourescence Spectrometry

Journalpaper

No abstract available.

URL: https://publications.hereon.de/id/16894/
Authors:Prange, A., Schwenke, H.
Year:1992
In: Advances in X-Ray Analysis
Issue:35
Pages: 899 - 923
Type:Journalpaper
ISBN: 0306442493
ISSN: 0069-8490
Cite as: Prange, A.; Schwenke, H.: Trace element analysis using Total Reflection X-ray Flourescence Spectrometry. In: Barrett, C.S.; Gilfrich, J.V.; Huang, T.C.; Jenkins, R.; McCarthy, G.J.; Predecki, P.K.; Ryon, R.; Smith, D.K. (Eds.): Advances in X-Ray Analysis. (1992) 35, 899 - 923. (ISBN: 0306442493)