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journal article,GKSS report

Trace element analysis using Total Reflection X-ray Flourescence Spectrometry

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  • URL: https://publications.hereon.de/id/16894/
  • Authors:Prange, A.,Schwenke, H.
  • Year:1992
  • In: Advances in X-Ray Analysis
  • Issue:35
  • Pages:899-923
  • Type:journal article,GKSS report
  • ISBN: 0306442493
  • ISSN: 0069-8490
  • Cite as: Prange, A.; Schwenke, H.: Trace element analysis using Total Reflection X-ray Flourescence Spectrometry. Advances in X-Ray Analysis. 1992. no. 35, 899-923.
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