Phase formation and microstructural development during solid-state reactions in Ti-Al multilayer films

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/16748/
Authors:Michaelsen, C., Woehlert, S., Bormann, R.
Year:1994
In: Polycristalline Thin Films: Structure, Texture, Properties and Applications
Location:San Francisco, CA (USA)
Date:04.-08.04.1994
Pages: 205 - 210
Type:Confpaper
Cite as: Michaelsen, C.; Woehlert, S.; Bormann, R.: Phase formation and microstructural development during solid-state reactions in Ti-Al multilayer films. In: Barmak, K.; Parker, M.A.; Floro, J.A.; Sinclair, R.; Smith, D.A. (Eds.): Polycristalline Thin Films: Structure, Texture, Properties and Applications. San Francisco, CA (USA), 04.-08.04.1994, 1994. 205 - 210.