Phase formation and microstructural development during solid-state reactions in Ti-Al multilayer films
No abstract available.
URL: https://publications.hereon.de/id/16748/
Authors:Michaelsen, C.,Woehlert, S.,Bormann, R.
Year:1994
In: Polycristalline Thin Films: Structure, Texture, Properties and Applications
Location:San Francisco, CA (USA)
Date:04.-08.04.1994
Pages:205-210
Type:conference paper,conference lecture
Cite as: Michaelsen, C.; Woehlert, S.; Bormann, R.: Phase formation and microstructural development during solid-state reactions in Ti-Al multilayer films. In: Barmak, K.; Parker, M.; Floro, J.; Sinclair, R.; Smith, D. (Ed.): Polycristalline Thin Films: Structure, Texture, Properties and Applications. San Francisco, CA (USA). 1994. 205-210.
