Transmission electron microscopy studies of solid state reactions in sputter-deposited Nb/Al multilayer thin films

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/16703/
Authors:Ma, F., Vivekanand, S., Barmak, K., Michaelsen, C.
Year:1996
In: Proceedings Microscopy and Microanalysis 1996
Location:Minneapolis, MN (USA)
Date:August 11-15, 1996
Pages: 1020 - 1021
Type:Confpaper
Cite as: Ma, F.; Vivekanand, S.; Barmak, K.; Michaelsen, C.: Transmission electron microscopy studies of solid state reactions in sputter-deposited Nb/Al multilayer thin films. In: Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. (Eds.): Proceedings Microscopy and Microanalysis 1996. Minneapolis, MN (USA), August 11-15, 1996, 1996. 1020 - 1021.