Transmission electron microscopy studies of solid state reactions in sputter-deposited Nb/Al multilayer thin films

conference paper,conference lecture

No abstract available.

URL: https://publications.hereon.de/id/16703/
Authors:Ma, F.,Vivekanand, S.,Barmak, K.,Michaelsen, C.
Year:1996
In: Proceedings Microscopy and Microanalysis 1996
Location:Minneapolis, MN (USA)
Date:August 11-15, 1996
Pages:1020-1021
Type:conference paper,conference lecture
Cite as: Ma, F.; Vivekanand, S.; Barmak, K.; Michaelsen, C.: Transmission electron microscopy studies of solid state reactions in sputter-deposited Nb/Al multilayer thin films. In: Bailey, G.; Corbett, J.; Dimlich, R.; Michael, J.; Zaluzec, N. (Ed.): Proceedings Microscopy and Microanalysis 1996. Minneapolis, MN (USA). 1996. 1020-1021.