Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy

conference paper,conference lecture

No abstract available.

URL: https://publications.hereon.de/id/16685/
Authors:Lucadamo, G.,Barmak, K.,Michaelsen, C.
Year:1996
In: Proceedings of Microscopy and Microanalysis 1996
Location:Minneapolis, MN (USA)
Date:August 11-15, 1996
Pages:1000-1001
Type:conference paper,conference lecture
Cite as: Lucadamo, G.; Barmak, K.; Michaelsen, C.: Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy. In: Bailey, G.; Corbett, J.; Dimlich, R.; Michael, J.; Zaluzec, N. (Ed.): Proceedings of Microscopy and Microanalysis 1996. Minneapolis, MN (USA). 1996. 1000-1001.